Dual EDS Instruments: Oxford Instruments Ultim Max 65 and JEOL EX-74211U4L2Q DRY SD30 DETECTOR

Ultim Max 65: 65 mm with Oxford Instruments Aztec software.

SD30 Detector: 15 mm with JEOL software.

Energy-Dispersine X-ray Spectroscopy or EDS provides data on the elemental composition of materials.

When paired with X-ray Diffraction the the results from EDS can produce a quantified composition of a material.

EDS can also map the distribution of elements in a given area or in material layers.

SEMx has two EDS instruments of slightly different capabilities due to the size of their sensors and respective software suites.

Having two EDS instruments also provides operation redundancy.