Intensive Search

SEMx drew on two decades of experience and 240 hours of research selecting instruments that deliver the promise of Accuracy, Integrity and Service. What does that mean in practical terms:

Quality

Each instrument was reviewed for its ability to deliver results that are exacting and repeatable; the two hallmarks of the scientific process. These characteristics produce Accuracy   every time while managing the inconsistencies of the human factors. Our customers demand reliable data for making critical decisions. SEMx has instruments of unrivaled quality.

Speed

Speed delivers production. Production creates efficiency. Your orders are turned around faster and at better value. SEMx invested in more than the instrument. Our facilities, industrial grade support equipment, computers and displays all ease sample preparation, process data faster and facilitate workflow enhancing the performance of our instruments and deliver Integrity and Service.

Ease of Use

Our instruments take advantage of the developments in user interfaces and automation: Touchscreens that work just like your favourite tablet, compatibility with the latest operating systems and processing that refines imaging and data at incredible resolutions. The result is reduced errors, lower operating costs and enhanced consistency. When equipment is easy to use, Accuracy is better. Integrity and Service are ensured by great delivery.


Scanning Electron Microscope (SEM) --JEOL JSM-IT300LV InTouchScope

Research Grade with two operation modes (High vacuum & Low vacuum modes): High resolution imaging for both conductive and nonconductive samples. High Vacuum resolution = 3.0nm at 30KV, Low Vacuum = 4.0nm at 30KV. Magnification = 5X to 300,000X at 300V to 30KV

High Vacuum & Low Vacuum Secondary Electron Detectors: Enhanced performance, deliver high resolution secondary electron images in both operation modes.

Backscattered Electron Detector: Provides composition data, topographic and variable shadow imaging

X-Ray Analysis – EDS, Elemental Mapping, Line Scan: Peltier cooled Silicon Drift Detector with EDS software. Delivers fast qualitative/quantitative, non-destructive elemental analysis (Beryllium to Uranium).  Measures elemental composition on a smaller area compared older instruments. Rapid chemical mapping and line scan that determines element distribution.

High resolution digital acquisition: imaging up to 5120 X 3840 pixels (4K is typically 3840 X 2160).

Large Vacuum Chamber: Large, irregularly-shaped samples can be viewed without destruction. Sample can be as large as 300mm in diameter and 80mm in height.

Five axis: X, Y, Z with T (10°-90° Tilt) & R (360° Rotation)

Video Sample Navigation: enables observation inside chamber. Image can be stored and recalled for future navigation.



X-ray Diffractometer (XRD) -- PANalytical AERIS

Aeris: The world’s first fully automatable benchtop XRD instrument with a built-in touch screen.

Rapid mineralogical phase analysis: Fast and precise phase identification is made possible by unique combination of high voltage generator and highly acclaimed PIXcel1D line detector.

Speed & Sensitivity Pack: Faster analysis and improved detection of minor phases.

RoboRiet Rietveld Refinement: RoboRiet refinement has a significant advantage over conventional quantitative methods. It uses pattern fitting structure refinement with no standards required to achieve results to within ±1%. Before RoboRiet an accurate and standardless quantitative phase analysis of complex materials using powder diffraction was almost impossible.


XRD + SEM (EDS) Combination

SEM and XRD the two most useful technologies for polycrystalline aggregates study. Together they can provide quantitative phase analysis and structure information, have been widely applied for the analysis such as ores, clays, refractories, alloys, corrosion products, wear products, industrial dusts and effluents. This analysis requires only a very small sample and is non-destructive.

EDS delivers elemental composition which can provide supporting information and accelerate XRD analysis and helps confirm the minor phases. EDS, XRD and Rietveld Refinement bring greater accuracy into quantitative analysis.


Laser Particle Sizer--MicroBrook 2000LD

MicroBrook 2000LD: In the past particle sizing was determined by sieving, sedimentation & electro or optical zone counting. For speed, repeatability, simplicity of automated operation and broad size ranges, laser diffraction and scattering now dominate in particle characterization.

Versatility: Wet, dry and small sample volume capability.

Broad size range: Wet Mode: 0.02 to 850um; Dry Mode: 0.1 to 850um.

Accurate measurement: Wet Mode: < 1% (CRM D50); Dry Mode: < 3% (CRM D50)

Repeatability: Wet Mode: < 1% (CRM D50); Dry Mode: < 3% (CRM D50)

Compliance: ISO 13320

Automated fill, internal circulation, dispersion, measurement & cleaning: Reduces human error, improves the accuracy and repeatability of the measurement.

Combines laser diffraction & high angle detection: A specially designed photoelectric detector array that includes 90 detectors guarantees the scattered signal of each particle will be received.

Unique dual angular range detection: Ensuring the instrument will receive all signals including weak signals at high angles from scattering of the smallest particles.

Automated Alignment: Assures the laser is perfectly aligned for accurate particle size distribution measurements.

Automated Calibration: Uses standard reference material and automated procedures.